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X2 STEM Lamella Preparation from Multi-composite Organic Electronic Device with ZEISS FIB-SEMs

Sticky Dic 19, 2018
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Topography and Refractive Index Measurement of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscopy

Sticky Set 11, 2018
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Smarter Analysis of Hardened Zones

Sticky Set 11, 2018
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Smart Weld Analysis

Sticky Set 11, 2018
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Optical Analysis of Shape and Roughness of a Gear Wheel

Sticky Set 11, 2018
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More efficiency in materials microscopy

Sticky Set 11, 2018
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Interference Contrast Microscopy for Subnanoscale Surface Roughness Characterization of Super-polished Glass

Sticky Set 11, 2018
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Microscopy in the Field of Tool Engineering

Sticky Set 11, 2018
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Microscopic Methods in Metallography

Sticky Set 11, 2018
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Light Microscopy of Solar Cells

Sticky Set 11, 2018
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