Scienze dei materiali
La scienza dei materiali è una disciplina basata sulla chimica, sulla fisica e in parte sull’ingegneria, che tratta la progettazione, la produzione e l’uso di tutte le classi esistenti di materiali (tra cui i metalli, le ceramiche, i semiconduttori, i polimeri e i biomateriali) e l’interazione dei materiali con l’ambiente, la salute, l’economia e l’industria. Viene anche posta attenzione sull’utilizzo di metodiche analitiche, distruttive o non distruttive, di natura meccanica, chimica o fisica necessarie per lo studio delle proprietà dei materiali e per la determinazione della conformità relativa agli standard d’uso specifici.
La scienza dei materiali è focalizzata sullo studio della struttura microscopica dei materiali e le relazioni esistenti tra sintesi, lavorazione e proprietà finali dei materiali.
In questa sezione troverete materiale scientifico a supporto delle vostre ricerche.
Materiale didattico
Elettronica e Semiconduttori
Elettronica e Semiconduttori
X2 STEM Lamella Preparation from Multi-composite Organic Electronic Device with ZEISS FIB-SEMs
Heiko Stegmann - Carl Zeiss Microscopy GmbH, Germany; Sylvia Mucke, Sven Quix - Plastic Logic GmbH, Germany
876.56 KB
Topography and Refractive Index Measurement of a Sub-μm Transparent Film on an Electronic Chip by Correlation of Scanning Electron and Confocal Microscopy
Matthias Vaupel Carl Zeiss Microscopy GmbH, Germany (Agosto 2014)
1.71 MB
Geoscienze e Beni Culturali
Geoscienze e Beni Culturali
Metallurgia
Metallurgia
Smarter Analysis of Hardened Zones
Dr. Lisa Weissmayer, Tim Schubert, Dr.Timo Bernthaler, Prof. Dr. Gerhard Schneider Aalen University, Materials Research Institute, (Aprile 2015)
1.04 MB
Smart Weld Analysis
Dr. Lisa Weissmayer, Tim Schubert, Dr. Timo Bernthaler, Prof. Dr. Gerhard Schneider Aalen University, Materials Research Institute (Febbraio 2015)
1.09 MB
Optical Analysis of Shape and Roughness of a Gear Wheel
Matthias Vaupel Carl Zeiss Microscopy GmbH, Germany (Agosto 2014)
1.16 MB
More efficiency in materials microscopy
Timo Bernthaler, Ralf Löffler, Thomas Samtleben Aalen University, Institute for Materials Research, Germany (Aprile 2012)
5.02 MB
Microscopy in the Field of Tool Engineering
Dr. Lisa Weissmayer, Tim Schubert, Dr. Timo Bernthaler, Prof. Dr. Gerhard Schneider Materials Research Institute, Aalen University, Germany (Agosto 2015)
3.44 MB
Microscopic Methods in Metallography
Gaby Ketzer-Raichle, Falko Knabe, Dr. Timo Bernthaler, Prof. Dr. Gerhard Schneider Aalen University, Technology and Business Materials Research Institute, Germany (Giugno 2016)
5.86 MB
Determining Laser-Welding Process Parameters
Johannes Neuer, Markus Hofele, Prof. Harald Riegel - Aalen University, LaserApplikationsZentrum (LAZ), Germany (Febbraio 2017)
1.02 MB
Analysis of Defects in a Laser-polished Surface
Markus Hofele, Steffen Mürdter, Tim Schubert, Dr. Timo Bernthaler, Prof. Dr. Gerhard Schneider, Prof. Dr. Harald Riegel - Aalen University, Laser Applications Center and Institute for Materials Research, Germany (Marzo 2017)
1.40 MB
Nanotecnologie e Nanofabbricazione
Nanotecnologie e Nanofabbricazione
X2 STEM Lamella Preparation from Multi-composite Organic Electronic Device with ZEISS FIB-SEMs
Heiko Stegmann - Carl Zeiss Microscopy GmbH, Germany; Sylvia Mucke, Sven Quix - Plastic Logic GmbH, Germany
876.56 KB
Nuovi Materiali e Materiali non Metallici
Nuovi Materiali e Materiali non Metallici
More efficiency in materials microscopy
Timo Bernthaler, Ralf Löffler, Thomas Samtleben Aalen University, Institute for Materials Research, Germany (Aprile 2012)
5.02 MB
Interference Contrast Microscopy for Subnanoscale Surface Roughness Characterization of Super-polished Glass
Matthias Vaupel Carl Zeiss Microscopy GmbH, Germany
766.28 KB
Light Microscopic Analysis of the Intrinsic Properties of Magnetically Hard Phases from the Domain Structure
Ralf Löffler, Dagmar Goll, Gerlinde Guth, Timo Bernthaler, Gerhard Schneider Aalen University, Materials Research Institute Volker Pusch Carl Zeiss Microscopy GmbH
2.38 MB
In situ SEM and Raman Investigations on Graphene
Isabel Guerra Tschuschke University Granada, Centro de Instrumentación Científica, Spain. Sébastien Maussang; David Reece Renishaw Ibérica, S.A.U, Spain. Philipp Vecera, Siegfried Eigler, Andreas Hirsch, Frank Hauke FAU Erlangen-Nürnberg, Zentralinstitut für Neue Scienze dei Materialien und Prozesstechnik (ZMP), Germany. Stefanie Freitag Carl Zeiss Microscopy GmbH, Germany (Settembre 2015)
814.40 KB
Graphene Characterization by Correlation of Scanning Electron, Atomic Force and Interference Contrast Microscopy
Matthias Vaupel - Training Application Support C., Carl Zeiss Microscopy GmbH, Germany
1.22 MB
Fast Routine Investigation of Additive-manufactured Al-Si Samples
Dr. Lisa Weissmayer, Sandra Gorse, Jörg Maier, Dr. Timo Bernthaler, Prof. Dr. Gerhard Schneider, Tim Schubert - Aalen University, Materials Research Institute (Settembre 2015)
3.22 MB
Correlative Microscopy - Investigating Structure-property Relationships in a Carbon-fiber Composite
Jeff Gelb - ZEISS X-ray Microscopy (Aprile 2017)
3.93 MB
Applications of Microscopy in Additive Manufacturing
Dr. Lisa Weissmayer, Tim Schubert, Dr. Timo Bernthaler, Prof. Dr. Gerhard Schneider Aalen University, Materials Research Institute (Febbraio 2015)
1Mb